SEM 6400 |
XRD 3720
|
AFM (ERC)
|
FIB FEI Strata DB235
 |
|
Hysitron
TriboIndenter (Nanomechanical Testing)  |
TEM 200CX |
TEM 2010F
|
FEI XL-40 / E-Beam Lithography
 |
Wyko Profilometer
|
SEM 6335F |
TEM 420
|
AFM Dimension 3100
|
| EPMA JEOL SUPERPROBE 733 (EDS & WDS)  |
KRATOS
XSAM 800 ESCA (Surface Analysis)  |
HT-XRD
|
SEM 6400
(2) |
UHV-XPS
|
AUGER
|
MRD X'Pert
 |
FTIR (MAE)
|