Click here to download a current list
of MAIC instrumentation

FACILITIES

Scanning Electron Microscopes
Transmission Electron Microscopes
Electron Probe Microanalysis
X-Ray Diffraction
Auger Spectroscopy
ESCA/XPS
Scanning Probe Microscopy
Surface Metrology
Fourier Transform Infrared (FTIR)
Focused Ion Beam (FIB)
E-Beam Lithography (NPGS)
Hysitron TriboIndenter

Instruments on Loan
KLA-Tencor

Using the Facilities
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